HAMIDON, Farish Armani; SUPIAN, Faridah Lisa; MAT DARUS, Mazlina; ABD KARIM, Nur Farah Nadia; WONG, Yeong Yi. A Comprehensive Study of 4-Sulfocalix[4]arene Thin Films with Atomic Force Microscopy: Thickness and Topographical Analysis. EDUCATUM Journal of Science, Mathematics and Technology, [S. l.], v. 12, p. 77–89, 2025. DOI: 10.37134/ejsmt.vol12.sp.8.2025. Disponível em: https://ejournal.upsi.edu.my/index.php/EJSMT/article/view/11327. Acesso em: 5 dec. 2025.